4th SMEOS 2016

Kruger National Park, Mpumalanga
Monday, 12 September 2016

 

 

 

 

 

Abstract submission for the 4th SMEOS 2016 Conference has now closed.  Notifications of acceptance of abstracts have already been sent to all submitters. Please contact the conference secretary if you have not received a notification yet. 

Deadline for submission of full, camera-ready papers: 30 September 2016


PROCEEDINGS
The Proceedings of this conference are published in the SPIE Digital Library along with over 435,000 papers from other outstanding conferences and SPIE Journals and books from SPIE Press.

SPIE publishes high-quality, peer-reviewed English-language journals that focus on topics that will be included in ISPhOA 2016: Optical Engineering; Journal of Electronic Imaging; Journal of Biomedical Optics; Journal of Micro/Nanolithography, MEMS, and MOEMS; Journal of Applied Remote Sensing; Journal of Nanophotonics; Journal of Photonics for Energy;Neurophotonics. SPIE invites researchers to submit journal-ready manuscripts related to ISPhOA 2016 topics to the appropriate journals. Please review the SPIE Journals guidelines related to conference proceedings and other matters before submitting a manuscript to an SPIE journal.

MANUSCRIPT FORMAT REQUIREMENTS

COPYRIGHT FORM

REVIEW STATEMENT
Please click here for a statement about the peer review process followed for the 4th SMEOS 2016 Proceedings.

IMPORTANT:
No presentation (either oral or poster) will be included in the conference programme if we have not received full payment for registration and accommodation for the presenting author by 20 August 2016

No paper will be included in the SMEOS 2016 Proceedings if it was not presented at the SMEOS 2016 conference, either as an oral or poster presentation.

THEMES
The major areas of contribution solicited for this conference include, but are not limited to:

Sensors
Sensor materials
Physical phenomena
Modelling and simulation
UV, visible light and IR detectors
Semiconductor sensors
Nanotechnology sensors
Fibre optic sensors
Laser-based sensors
Magnetic sensors
Biosensors
Smart sensors
Sensor networks

MEMS
MEMS materials
MEMS processing and fabrication technology
Modelling, simulation and verification
Optical MEMS (MOEMS)
IR MEMS
RF MEMS
Microfluidic systems
Nano-electro-mechanical systems (NEMS)
Nanophotonics
Novel MEMS devices

Electro-optical systems (EOS)
Imaging EOS systems
Laser EOS systems
CMOS Integration of EOS
EOS readout integrated circuits (ROICs)
Optical design
EOS architecture
Assembly and packaging
Testing and reliability

Applications
Metrology
Earth observation / remote sensing
Space
Aerospace
Solar energy
Security
Health
Environment

 

Contact Information



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