Description

The ​IEEE ​International ​Integrated ​Reliability ​Workshop ​(IIRW) ​focuses ​on ​ensuring ​electronic ​device ​reliability ​through ​fabrication, ​design, ​testing, ​characterization, ​and ​simulation, ​as ​well ​as ​identification ​of ​the ​defects ​and ​physical ​mechanisms ​responsible ​for ​reliability ​problems.

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